Quantitative analysis by energy dispersive X-ray fluorescence by the transmission method applied to geological samples

Author:

Simabuco S.M.1,Nascimento Filho V.F.2

Affiliation:

1. UNICAMP, Brasil

2. USP, Brasil

Abstract

Three certified samples of different matrices (Soil-5, SL-1/IAEA and SARM-4/SABS) were quantitatively analysed by energy dispersive X-ray fluorescence with radioisotopic excitation. The observed errors were about 10-20% for the majority of the elements and less than 10% for Fe and Zn in the Soil-5, Mn in SL-1, and Ti, Fe and Zn in SARM-4 samples. Annular radioactive sources of Fe-55 and Cd-109 were utilized for the excitation of elements while a Si(Li) semiconductor detector coupled to a multichannel emulation card inserted in a microcomputer was used for the detection of the characteristic X-rays. The fundamental parameters method was used for the determination of elemental sensitivities and the irradiator or transmission method for the correction of the absorption effect of characteristic X-rays of elements on the range of atomic number 22 to 42 (Ti to Mo) and excitation with Cd-109. For elements in the range of atomic number 13 to 23 (Al to V) the irradiator method cannot be applied since samples are not transparent for the incident and emergent X-rays. In order to perform the absorption correction for this range of atomic number excited with Fe-55 source, another method was developed based on the experimental value of the absorption coefficients, associated with absorption edges of the elements.

Publisher

FapUNIFESP (SciELO)

Subject

Agronomy and Crop Science,Animal Science and Zoology

Reference8 articles.

1. Principles and practice of x-ray spectrometric analysis;BERTIN P.B.,1975

2. Calibration of tube excited energy-dispersive X-ray spectrometers with thin film standards and with fundamental constants;ESPEN P. van;X-Ray Spectrometry,1981

3. A computer analysis of X-ray fluorescence spectra;ESPEN P. van;Nuclear Instruments and Methods,1977

4. Trace element determination with semiconductor detector X-ray spectrometers;GIAUQUE R.D.;Analytical Chemistry,1973

5. A new method for matrix corrections by radioisotope excited X-ray fluorescence;HALLAK A.B.;X-Ray Spectrometry,1983

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