Model to estimate the sampling density for establishment of yield mapping

Abstract

Yield mapping represents the spatial variability concerning the features of a productive area and allows intervening on the next year production, for example, on a site-specific input application. The trial aimed at verifying the influence of a sampling density and the type of interpolator on yield mapping precision to be produced by a manual sampling of grains. This solution is usually adopted when a combine with yield monitor can not be used. An yield map was developed using data obtained from a combine equipped with yield monitor during corn harvesting. From this map, 84 sample grids were established and through three interpolators: inverse of square distance, inverse of distance and ordinary kriging, 252 yield maps were created. Then they were compared with the original one using the coefficient of relative deviation (CRD) and the kappa index. The loss regarding yield mapping information increased as the sampling density decreased. Besides, it was also dependent on the interpolation method used. A multiple regression model was adjusted to the variable CRD, according to the following variables: spatial variability index and sampling density. This model aimed at aiding the farmer to define the sampling density, thus, allowing to obtain the manual yield mapping, during eventual problems in the yield monitor.