ToF-SIMS Characterization of Nanostructured ZrO2 Coatings Applied to Near Equiatomic Ni-Ti Alloy-Reference-Cited by-同舟云学术

ToF-SIMS Characterization of Nanostructured ZrO2 Coatings Applied to Near Equiatomic Ni-Ti Alloy

Published:2019 Issue:suppl 1 Volume:22 Page:
ISSN:1980-5373
Container-title:Materials Research
language:
Short-container-title:Mat. Res.

Author:

Lopes Natalia Isabel de Azevedo¹^ORCID,Freire Nelson Henrique Jardim¹^ORCID,Resende Pedro Damas¹^ORCID,Silva Jéssica Dornelas¹^ORCID,Santos Leandro de Arruda¹,Béclin Franck²^ORCID,Buono Vicente Tadeu Lopes¹

Affiliation:

1. Universidade Federal de Minas Gerais, Brasil

2. Université de Lille, France

Publisher

FapUNIFESP (SciELO)

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Link

http://www.scielo.br/pdf/mr/v22s1/1980-5373-mr-22-s1-e20190189.pdf

Reference22 articles.

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2. Characterization challenges for nanomaterials;Baer DR;Surface and Interface Analysis,2008

3. Time-of-flight secondary ion mass spectrometry (TOF-SIMS): - versatility in chemical and imaging surface analysis;Sodhi RNS;Analyst,2004

4. Time-of-flight secondary ion mass spectrometry: techniques and applications for the characterization of biomaterial surfaces;Belu AM;Biomaterials,2003

5. Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization;Stevie FA,2015

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