A PRISMA-driven systematic review of data mining methods used for defects detection and classification in the manufacturing industry
Author:
Affiliation:
1. Vysoká škola ekonomická v Praze, Czech Republic
Publisher
FapUNIFESP (SciELO)
Subject
Industrial and Manufacturing Engineering
Link
http://www.scielo.br/pdf/prod/v32/0103-6513-prod-32-e20210097.pdf
Reference87 articles.
1. Wafer classification using support vector machines;Baly R.;IEEE Transactions on Semiconductor Manufacturing,2012
2. Vox Populi 4.0: big data tools zoom in on the voice of the customer;Bowers K.;Quality Progress,2019
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