Study on Needles and Cracks of Tin-doped Indium Oxide Tablets for Electron Beam Evaporation Process
Author:
Affiliation:
1. Guilin University of Electronic Technology, China; Shaanxi Normal University, China
2. Shaanxi Normal University, China
3. Guilin University of Electronic Technology, China
Publisher
FapUNIFESP (SciELO)
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Link
http://www.scielo.br/pdf/mr/v18n3/1516-1439-mr-18-3-519.pdf
Reference17 articles.
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2. Structural, electrical, optical properties and reliability of ultra-thin tin doped indium oxide films for touch panels;Xu J;Journal of Materials Science Materials in Electronics,2014
3. Optical analysis of Cr-doped ITO films deposited by double-target laser ablation;Cesaria M;Journal of Luminescence,2015
4. Effect of substrate temperature on physical properties of In2O3:Sn films deposited by e-beam technique;Mohamed HA;International Journal of Physical Sciences,2012
5. Study of the functional properties of ITO grown by metalorganic chemical vapor deposition from different indium and tin precursors;Szkutnik PD;Journal of Alloys and Compounds,2014
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1. Nanostructured Indium Oxide Thin Films as a Room Temperature Toluene Sensor;ACS Omega;2021-07-01
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