A control chart for time truncated life tests using type-ii generalized log logistic distribution

Abstract

In this paper, an attribute control chart is aimed when the lifetime of the item follows Type-II generalized log-logistic distribution (TGLLD) under a time truncated life test assuming that the common scale parameter is known. Average run length (ARL) is used to assess the performance of the aimed control chart. Simulation technique is developed to present the performance of the control charts at a specified average run length (ARL), shift constant and for different parametric values of shape and scale parameters, sample size. The results are illustrated with live data example.