Abstract
AbstractIn this paper we examine a recently proposed concept for obtaining sub-pixel spatial resolution in compound semiconductors where hole transport properties are relatively poor. [1] This approach uses weighted sums and differences of local pixel signals to extract both accurate x-ray energy estimates and interpolate location at the sub-pixel level. A simple analysis, including noise estimates, suggests the possibility of obtaining locations at the 50–100 micron level using 1–2 mm wide stripe electrodes while obtaining 1–2% energy resolution for x-rays up to 100 keV. Following this examination, we will present the most recent experimental results from our program to develop electronics to implement this scheme.
Publisher
Springer Science and Business Media LLC
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