Author:
Teowee G.,McCarthy K. C.,McCarthy F. S.,Davis D. G.,Dawley J. T.,Zelinski B.J.J.,Uhlmann D. R.
Abstract
ABSTRACTA series of sol-gel derived PB(Zn1/3Nb2/3)O3-PbTiO3 (PZN-PT) films, with various PbTiO3 contents, have been prepared on platinized Si wafers. The (l-x)PZN - xPT films fired to 700C became single phase perovskite for x > 0.7. In the PZN-0.1PT films, the films still contain pyrochlore phase at a firing temperature of 850C; the perovskite phase appeared at a firing temperature of 800C. The dielectric constant increased with increasing PT content, with a peak in dielectric constant at x = 0.8. PZN-PT films with x = 0.8 exhibited dielectric constant, dissipation factor, remanent polarization and coercive field values of 600, 0.10, 6 and 45 kV/cm respectively.
Publisher
Springer Science and Business Media LLC
Cited by
2 articles.
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