Author:
Gödickemeier M.,Michel B.,Orliukas A.,Bohac P.,Sasaki K.,Gauckler L.,Heinrich H.,Schwander P.,Kostorz G.,Hofmann H.,Frei O.
Abstract
The electrical conductivity of 3Y-TZP ceramics containing SiO2 and Al2O3 has been investigated by complex impedance spectroscopy between 500 and 1270 K. At low temperatures, the total electrical conductivity is suppressed by the grain boundary glass films. The equilibrium thickness of intergranular films is 1-2 nm, as derived using the “brick-layer” model and measured by HRTEM. A change in the slope of the conductivity Arrhenius plots occurs at the characteristic temperature Tb at which the macroscopic grain boundary resistivity has the same value as the resistivity of the grains. The temperature dependence of the conductivity is discussed in terms of a series combination of RC elements.
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Cited by
124 articles.
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