Author:
Adel H.,Hsiao B.,Mitchell G.,Rightor E.,Smith A. P.,Cieslinski R.
Abstract
AbstractWe describe how the scanning transmission x-ray microscope at Brookhaven National Laboratory can be used to investigate the bulk characteristics of polymeric materials with chemical sensitivity at a spatial resolution of about 50 nm. We present examples ranging from unoriented multiphase polymers to highly oriented Kevlar fibers. In the case of oriented samples, a dichroism technique is used to determine the orientation of specific chemical bonds. Extension of the technique to investigate surfaces of thick samples is discussed.
Publisher
Springer Science and Business Media LLC