Author:
Robertson Brian W.,Holm Chandra,Lin Yang-Pi,Corbin Stephen F. J.,Wilkinson David S.
Abstract
AbstractAs a preliminary step to detailed study of the interfaces in SiC particulatereinforced Al alloys, a number of methods of sample preparation have been explored; the resultant artefacts on the thinned foils observed in transmission electron microscopes are discussed and improvements to the preparation procedures are suggested. Initial observations of the microstructure of two alloys differing significantly in their matrix silicon content are presented.
Publisher
Springer Science and Business Media LLC
Cited by
1 articles.
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