Characterization of Lead Zirconate-Titanate Thin Films Prepared by Pulsed Laser Deposition

Author:

Chiang C. K.,Wong-Ng W.,Schenck P. K.,Cook L. P.,Vaudin M. D.,Brody P. S.,Rod B. J.,Bennett K. W.

Abstract

AbstractDense smooth lead zirconate-titanate thin films have been prepared by excimer laser deposition. The as-deposited films are amorphous as indicated by x-ray powder patterns. Differential scanning calorimetry studies show that the film has a glass transition at 301 °C, and the amorphous to crystalline transformation takes place above 350°C to 650°C. Phase formation as a result of post-deposition heat treatment is described.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference6 articles.

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2. 1. Schenck P.K. , Cook L.P. , Zhao J. , Farabaugh E.N. , and Chiang C.K. , Proc. Symposium on Beam Solid Interaction: Physical Phenomena, ed. Myers E.R. and Kingon A.I. , Mat. Res. Soc., 157A, 587, (1990)

3. Lead Zirconate-Titanate Thin Films Prepared by the Laser Ablation Technique

4. Properties of piezoelectric ceramics in the solid-solution series lead titanate-lead zirconate-lead oxide: Tin oxide and lead titanate-lead hafnate

5. 6. Cook L.P. , Schenck P.K. , Zhao J. , Farabaugh E.N. , Chiang C.K. and Vaudin M.V. , Ceramic Transactions: Ceramic Thin and Thick Films, ed. Hiremath B.V. , page 99, (1990).

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