Metastable Phase Equilibria in Co-Deposited Ni1−xZrx Thin Films

Abstract

AbstractWe determine the glass forming range (GFR) of co-deposited Ni1−xZrx (0 < x < 1) thin films by measuring their electrical resistance during in situ constant-heating-rate anneals. The measured GFR is continuous for 0.10 < x < 0.87. We calculate the GFR of Ni-Zr melts as a function of composition and cooling rate using homogeneous nucleation theory and a published CALPHAD-type thermodynamic modeling of the equilibrium phase diagram. Assuming that the main competition to the retention of the amorphous structure during the cooling of the liquid comes from the partitionless crystallization of the terminal solid solutions, we calculate that for dT/dt = 1012 K s−1, the GFR extends to x = 0.05 and x = 0.96. Better agreement with the measured values is obtained assuming a lower ‘effective’ cooling rate during the condensation of the films.