Abstract
AbstractThe light-induced performance degradation of amorphous silicon solar cells is described well by a model in which the carrier lifetimes are determined by the dangling bond density. The kinetics of the defect generation follow the model in which band-to-band recombination provides the energy for the creation of dangling bonds, which in turn introduce gap states that reduce carrier lifetime. Degradation will be slower in solar cells operating at lower excess carrier concentrations. This is documented with a comparison of degradation data for cells of different i-layer thickness, cells operating at open circuit vs. load, and for single vs. cascade cells. The model also correctly predicts the relation between short circuit current and fill factor degradation. At sufficiently long times, the efficiency will decrease at approximately the same rate for all cell structures and dimensions, with an offset in time between different device types which can be calculated.
Publisher
Springer Science and Business Media LLC
Cited by
5 articles.
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