Author:
Kiguchi Takanori,Konno Toyohiko J.,Ehara Yoshitaka,Yamada Tomoaki,Funakubo Hiroshi
Abstract
AbstractThe growth mechanism of large-size domains in PbTiO3/SrTiO3 heteroepitaxial thin films was examined using annular bright field (ABF) – scanning transmission electron microscopy and geometric phase analysis (GPA). {101} domain walls surrounded 90° domains. The large 90° domain grows by the coalescence of the nano-size domains of less than 5 nm width. A strain map obtained from the GPA of ABF-STEM image showed that 90° domains interacted elastically and attractively with edge dislocations at PbTiO3/SrTiO3 interface through simple shear strain.
Publisher
Springer Science and Business Media LLC
Cited by
1 articles.
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