Heteroepitaxial growth of C60 on tetracene single crystal

Abstract

ABSTRACTWe have developed a method for epitaxial growth of C60 thin films on tetracene single crystals. The crystal orientation of the C60 film was examined by reflection high energy electron diffraction (RHEED) and X-ray diffraction (XRD). In-situ observation by RHEED revealed that the C60 crystallizes from the very initial stage of the deposition (0.1 nm). A 6-fold symmetric pattern, which was observed in a XRD polar scan, can be taken as direct evidence for the epitaxial growth of C60 commensurate with the tetracene (001) surface lattice.