Author:
Kelly Tony D.,Petrosky James C.,McClory John W.,Zens Timothy,Turner David,Mann J. Matthew,Kolis Joseph W.,Colón Santana Juan A.,Dowben Peter A.
Abstract
ABSTRACTThe electronic properties of ThO2 single crystals were studied using x-ray photoemission spectroscopy (XPS). The XPS results show that the Th 4f core level is in an oxidation state that is consistent with that expected for Th in ThO2. The effective Debye temperature is estimated from the temperature dependent photoemission intensities of the Th 4f core level over the temperature range of 290 to 360 K. A Debye temperature of 468±32 K has been determined.
Publisher
Springer Science and Business Media LLC
Cited by
5 articles.
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