The Anomalous Behavior of Silicon During Nanoindentation

Abstract

ABSTRACTTwo separate phenomena occur during the low-load indentation of silicon which make its behavior distinctly different from that of most materials. First, silicon is one of only a very few materials whose hardness exceeds the pressure needed to transform it to a denser crystalline (or amorphous) form, and because of this, a reversible, pressure-induced phase transformation occurs during indentation. The transformation enhances the electrical conductivity of the material and creates a region around the indenter which flows like a soft metal. Second, silicon cracks when indented by a Berkovich or Vickers indenter at loads of less than 100 mN, i.e., loads typically used in nanoindentation experiments. These two phenomena, which account for a number of unusual features in the indentation load-displacement behavior, are documented and discussed.