Author:
Von Der Linden M. B.,Schropp R. E. I.,Stammeijer J. G. F.,Van Der Weg W. F.
Abstract
ABSTRACTInformation about the spatial collection efficiency in a-Si:H solar cells is obtained from the Dynamic Inner Collection Efficiency (DICE) technique. With this non-destructive method single junction solar cells with efficiencies up to 10 % have been analysed under operating conditions. The influence of i-layer deposition parameters, such as the temperature and deposition time, on the spatial collection efficiency have been investigated. Deposition parameters for the i-layer have a large influence on the collection from the first 100 nm from the p+/i-interface. A higher i-layer deposition temperature or a longer deposition time results in a higher internal collection efficiency at a depth of 70 nm into the i-layer. Also results of DICE experiments on various textured TCO substrates are presented.
Publisher
Springer Science and Business Media LLC
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