Author:
Borchers J.A.,Gehring P.M.,Majkrzak C.F.,Ankner J.F.,Hylton T.L.,Coffey K.R.,Parker M.A.,Howard J.K.
Abstract
ABSTRACTSputtered Ni80Fe20/Ag multilayers, annealed post-growth, show giant magnetoresistive (GMR) effects at unusually low magnetic fields (≈ 5 Oe)[l]. Structural characterization by cross-sectional TEM[2] and x-ray diffraction indicates that the Ag preferentially diffuses into the Ni80Fe20 layers at the interfaces. Using polarized-neutron specular reflectivity, we have obtained magnetization depth profiles for a series of annealed [Ni8oFe2o(20Å)/Ag(40Å)]4 multilayers. Though GMR in related materials is associated with coherent antiferromagnetic alignment of the ferromagnetic layers, specular neutron data for the Ni80Fe20/Ag multilayers show no trace of half-order spin-flip intensity characteristic of this simple structure. In small applied fields, transverse scans at the half-order position show a broad feature which disappears upon saturation. These data suggest that while the Ni80Fe20 moments are antiferromagnetically correlated along the growth axis, the in-plane magnetic domains are only of micron-order size and are thus not apparent in a specular measurement.
Publisher
Springer Science and Business Media LLC
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2. 12 Due to interference effects from the cap and base layers, the x-ray fits are not highly sensitive to the relative thicknesses of the Ni80Fe20 and Ag layers or to their individual scattering densities. While these fits are not unique, they were guided by subsequent neutron reflectivity analysis.
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