Author:
Bertero G. A.,Sinclair R.
Abstract
ABSTRACTA series of Pt/Co multilayers were sputter-deposited under various deposition conditions to promote structural changes resulting in marked differences in both the perpendicular anisotropy and magnetic coercivity. High resolution transmission electron microscopy was used in combination with other analytical techniques to study the structure of these films. It was found that the most important feature controlling the magnitude of the anisotropy is the interface sharpness. Conversely properties such as the quality of the (111) texture, grain shape or the defect structure, were found to be of secondary importance. The magnetic coercivity ranged from 0.6 to 7 kOe depending on the sputtering conditions and was found to depend strongly on the grain boundary structure rather than on the grain size.
Publisher
Springer Science and Business Media LLC
Cited by
4 articles.
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