Author:
Phiri R. R.,Oladijo O. P.,Akinlabi E. T.
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference17 articles.
1. D. S. Parker, “Defense Technical Information Center Compilation Part Notice Coatings on High Strength Steel,” 2003.
2. B. R. York, “Residual Stress/Strain Analysis in Thin Films by X-ray Diffraction,” Crit. Rev. Solid State Mater. Sci., vol. 20, no. 2, pp. 125–177, 1995.
3. P. Waters, “Stress analysis and mechanical characterization of thin films for microelectronics and MEMS applications,” no. 2008, pp. 1–215, 2008.
4. J. Vlassak, “Thin Film Mechanics,” Harvard Univ., 2004.
5. P. J. J. Withers and H. K. D. H. K. D. H. Bhadeshia, “Residual stress Part 1–Measurement techniques,” Mater. Sci. Technol., vol. 17, no. 4, pp. 355–365, 2001.