GaN-on-Si HEMTs: From Device Technology to Product Insertion

Author:

Johnson Wayne,Singhal Sameer,Hanson Allen,Therrien Robert,Chaudhari Apurva,Nagy Walter,Rajagopal Pradeep,Martin Quinn,Nichols Todd,Edwards Andrew,Roberts John,Piner Edwin,Kizilyalli Isik,Linthicum Kevin

Abstract

ABSTRACTIn the last decade, GaN-on-Si has progressed from fundamental crystal growth studies to product realization and reliability demonstration. GaN-on-Si HEMTs addressing cellular, WiMAX, and broadband RF applications are now commercially available and offer GaN performance attributes in a cost-competitive platform. This presentation will briefly describe the underlying GaN-on-Si material, process, and packaging technology, then focus primarily on performance of these products in both commercial and military applications.All Nitronex NRF1 GaN-on-Si products are grown by MOCVD on 100 mm float-zone Si (111) substrates. A proprietary, strain-compensating (Al,Ga)N transition layer and an amorphous SixAl1-xNy nucleation layer are employed to accommodate lattice and thermal expansion mismatch between the substrate and the epilayers. The wafer fabrication process employs Ti/Al-based ohmic contacts, ion implant device isolation, 0.5 um dielectrically-defined gates, gold airbridge interconnects, and through-wafer source vias. Typical inline DC parametrics include 2DEG sheet resistance of 490 ohms/sq., on-resistance of 3 ohm-mm, peak drain current density of 830 mA/mm, and breakdown voltage of >100V. Packaging solutions include traditional LDMOS-style air cavity outlines with thermally-enhanced flange materials and low-cost plastic SOIC.A family of devices addressing emerging OFDM-based applications such as WiMAX has been developed. WiMAX amplifiers require several watts of linear output power with frequency band allocations ranging from 2.3 to 5.8 GHz and instantaneous bandwidth up to ∼15%. Translated to the transistor level, this implies simultaneous high frequency and high voltage capability – attributes well-suited to the inherent advantages of GaN-based devices. The flagship product in this family is NPT25100, delivering 125W of peak envelope power at 2.5 GHz. Under 2.5 GHz single-carrier OFDM modulation and 10 MHz channel bandwidth, this device produces 10W linear power at 2.0% EVM with 16.5dB associated gain and 26% drain efficiency. The excellent bandwidth of NRF1 devices enables the same device to operate at cellular frequencies from 2.11 - 2.17 GHz, producing >20W average power at an adjacent channel power ratio of -35 dBc.Primary military insertion opportunities include communications (e.g., JTRS - Joint Tactical Radio System) and electronic warfare (e.g., jammers). For EW applications, broadband operation reduces system-level component count and decreases weight / footprint. A family of 48V GaN-on-Si broadband HEMTs has been developed to deliver power levels from 40W - 180W in a compact package. In the highest power case, packaged “power density” (defined as peak output power divided by package volume) reaches ∼650 W/cm3. These power levels – in an outline suitable for highly portable systems – enable improved communications transmit distance and extend the umbrella size of electronic protection units.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference2 articles.

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3