Structural Characterization of Fullerene thin Films Fabricated by Organic Molecular Beam Deposition

Author:

Yase Kiyoshi,Saraya Takuya,Kudo Kazuhiro

Abstract

ABSTRACTFullerene C60 thin solid films have been fabricated on the (001) surfaces of alkali halides (NaCl, KCI and KBr) and muscovite by organic molecular beam deposition (OMBD) technique. Pure C60 powder was sublimated from the precisely temperature-controlled K-cell at low pressure (10−7 Torr) and deposited onto the substrates kept in the range 125 –300 °C. Increasing both the temperature of K-cell and the substrate temperature, fine crystals grow with different size, shape and distance between neighbors. The dependence of the size and density of island crystals on the deposition conditions revealed the mechanism of crystal growth and the effect of interaction between molecules and substrate surface.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Control of polymorphic occurrence of behenic acid thin films in physical vapor deposition;Journal of Crystal Growth;1999-09

2. Crystal growth and control of molecular orientation and polymorphism in physical vapor deposition of long-chain compounds;Advances in the Understanding of Crystal Growth Mechanisms;1999

3. CSVT Growth of Fullerene Polycrystalline Films;Fullerene Science and Technology;1998-09

4. Epitaxial Growth Mechanism of Titanyl-Phthalocyanine on Solid Substrates;Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals;1998-05

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