Abstract
AbstractIn solid ionic conductors, the hopping motion of the mobile charged defects is strongly influenced by their mutual repulsive interaction. Therefore, their jump diffusion ist not a random process. Instead, correlated forward-backward hopping sequences are a common phenomenon, constituting the elementary steps of jump relaxation. The microscopic dynamics of the relaxation is described in a simple model which yields the frequency spectrum of the hopping motion. With the help of this function, it is possible to explain experimental spectra displaying the so-called “universal” dynamic response. In particular we reproduce the frequency dependent ionic conductivity of fast ion conductors and the arcs in their complex-conductivity and complex-permittivity planes. The model also explains the non-BPP-type behavior of spin-lattice relaxation times and the broad components of quasielastic neutron scattering spectra. Examples are presented and discussed.
Publisher
Springer Science and Business Media LLC
Cited by
8 articles.
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