Synchrotron X-Ray Scattering Studies of the Surface Structure and Dynamics of Liquids and Liquid Films

Abstract

AbstractThe dynamics of surface fluctuations in thin supported polystyrene films have been investigated using x-ray photon correlation spectroscopy (XPCS) in reflection geometry. The results from the films thicker than four times of the radius of gyration (Rg) of polystyrene show the behavior of the capillary waves expected in viscous liquid. However, thinner films show a deviation indicating the need to account for viscoelasticity. Theoretical considerations with viscoelastic liquid model has been performed by introducing frequency dependent viscosity and compared with Fredrickson’s brush model (Macromolecules, 25, 2882 (1992)). The theory has been extended to the surface and interfacial modes in a bilayer film system. The results will be discussed in terms of surface tension, viscosity, and shear modulus.