Sample Preparation Technique for Examination of SiC Whisker Cross-Sections-Reference-Cited by-同舟云学术

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Sample Preparation Technique for Examination of SiC Whisker Cross-Sections

Published:1987 Issue: Volume:115 Page:
ISSN:0272-9172
Container-title:MRS Proceedings
language:en
Short-container-title:MRS Proc.

Author:

Bradley S. A.,Dietz N. L.,Karakek K. R.

Abstract

ABSTRACTAn ultramicrotomy technique for preparing SiC whisker cross-sections is described. With this method a large number of axially oriented whiskers can be examined.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference4 articles.

1. Growth Faults in β Silicon Carbide Whiskers

2. Defects in Silicon Carbide Whiskers

3. A study of contrast bands in β-SiC whiskers

4. Defect identification in vapour-grownβ-SiC whiskers

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. TEM specimen preparation and characterization of ceramic coatings on fiber tows;Thin Solid Films;1997-10

2. Transmission Electron Microscopy Specimen Preparation of Ceramic Coatings on Ceramic Fibers;MRS Proceedings;1997

3. Preparation of Thin Sections of Coated Fibers for Characterization by Transmission Electron Microscopy;Journal of the American Ceramic Society;1996-09

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