Raman Scattering and Photoluminescence of Spontaneously Ordered Ga0.5In0.5P Alloy

Abstract

AbstractSamples of the spontaneously ordered Ga0.5In0.5P alloys were grown by the MOCVD method on [001]-oriented GaAs substrates. The thickness of the epitaxal layer is about 2 μm. Raman scattering and photoluminescence spectra have been measured at room temperature. The result from photoluminescence measurement indicates that the direct-band gaps of the spontaneously ordered samples are lower than that of the disordered sample. Three scattering peaks have been observed in the Raman spectra, corresponding to the GaP-like LO, InP-like LO and InP-like TO modes in the alloys, respectively. The frequencies of the GaP- and InP-like LO modes increase with the decrease of the band-gap of the ordered alloys. It is related to the formation of the (GaP)1/(InP)1 monolayer superlattice along [111] direction in the ordered alloys. The polarization properties of the ordered alloys are similar to those of the bulk III-V semiconductors with the zinc-blende structure.