Identification of partial dislocations and faults in cubic Al3Ti

Author:

Zhang S.,Milligan W.W.,Mikkola D.E.

Abstract

Dislocation dissociations in Al3Ti alloys modified with Mn to stabilize the L12 cubic structure have been studied with transmission electron microscopy and computer simulation of images. Dissociations of a〈110〉 superdislocations into pairs of a/2〈110〉 partials bounding APB's were observed at all temperatures from room temperature to 700 °C. Asymmetrical image contrast, in which one of the a/2〈110〉 partials gives a much more intense image than the other, was observed at small separations of the partials. Although some investigators have taken such asymmetry to suggest SISF-type dissociations in similar alloys, the current work demonstrates that the asymmetry is fully consistent with APB-type dissociation. Further, the degree of image asymmetry decreases as the spacing of the partials increases. It is concluded that identification of the partial dislocations with “near-invisibility criteria” for fractional values of g · b is unreliable, and that computer simulation of images is useful for identification of the partials. However, as expected, the ability to distinguish simulated bright-field images of APB- and SISF-type dissociations also becomes difficult as the separation of the partials becomes very small. Under these conditions, both weak-beam imaging and simulations are necessary to identify the dissociations. Weak-beam simulations have shown that fringe contrast must be present under certain imaging conditions for SISF dissociations, and this contrast has never been observed in this study or in previously published studies of dissociated single superdislocations in cubic Al3Ti alloys. Finally, APB contrast formed with superlattice reflection imaging has been observed between partials on both {111} and {100} after deformation at 700 °C.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

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