Author:
Wong C. K. H.,Chan Y. C.,Pfleger J.,Lam Y. W.,Leung K. M.,Chiu D. S.
Abstract
The effect of ultraviolet irradiation on the xerographic sensitometry of organic photoreceptors was studied. Absorbed ultraviolet light decreased both the dark decay and the photoinduced discharge rates, and an increased buildup of the residual potential was observed. Above a threshold dose of ultraviolet irradiation, the residual potential was seen to decrease, and at the same time a slight increase of the hardness of the photoreceptor surface was detected. These behaviors originate from a decrease in the density of charge transport sites which is caused by the photochemical changes in the charge transport layer system.
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Cited by
4 articles.
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