Author:
Hams V. G.,Das B. N.,Elam W. T.,Koon N. C.
Abstract
AbstractThe amorphous-to-crystalline transition in sputter-deposited amorphous Tb33Fe66 films has been studied using a conversion-electron extended X-ray absorption (EXAFS) technique. Modeling of the EXAFS data using theoretical and empirical standards allowed the quantitative measurement of coordination, radial distance, and disorder of local atom shells around the Fe sites after varying degrees of heat treatments.
Publisher
Springer Science and Business Media LLC