XAFS Characterization of Cu-Doped ZnO Films

Abstract

ABSTRACTThis paper describes x-ray absorption measurements made on 10 to 16-μm-thick films of ZnO, which contained 5 mol% CuO, and were grown by reactive sputtering. We compare our experimental near-edge and XAFS results to models for Cu-O phases and Cu incorporation into the ZnO lattice, and we conclude that roughly half of the Cu atoms are substitutional for Zn on the wurtzite lattice and the other half is in a highly disordered phase, which has an XAFS signature which is similar to disordered CuO. Our results are compared to other structural studies of Cu-doped ZnO materials.