Abstract
AbstractPolycrystalline samples of alpha-alumina have been irradiated with various ions ranging from 3.6 MeV Fe+ to 1 MeV H+ ions at 650°C. Cross-section transmission electron microscopy was used to investigate the depth-dependent microstructure of the irradiated specimens. The microstructure following irradiation was observed to be dependent on the irradiation spectrum. In particular, defect cluster nucleation was effectively suppressed in specimens irradiated with light ions such as I MeV H+ ions. On the other hand, light ion irradiation tended to accelerate the growth rate of dislocation loops. The microstructural observations are discussed in terms of ionization enhanced diffusion processes.
Publisher
Springer Science and Business Media LLC
Cited by
5 articles.
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