Author:
Loloee R.,Crimp M.A.,Zhu W.,Pratt W.P.
Abstract
AbstractEpitaxial single crystal Nb films have been grown by sputter deposition on (1 1 2 0) sapphire substrates. Subsequently, high quality epitaxial Cu films, with two orientation variants, have been grown onto the epitaxial Nb films. The sputtered films have been characterized using atomic force microscopy, electron backscattered patterns, and conventional transmission electron microscopy.
Publisher
Springer Science and Business Media LLC
Cited by
5 articles.
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