Comparative Studies of Pb/Cu(001) by TEM, AFM and STM
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Published:1998
Issue:
Volume:528
Page:
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ISSN:0272-9172
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Container-title:MRS Proceedings
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language:en
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Short-container-title:MRS Proc.
Author:
Bocquet Franck,Cohen Camille,Schmaus Didier,Rocher André,Crestou Jacques,Gauthier Sèbastien
Abstract
AbstractThe same specimen of Pb/Cu grown under Ultra High Vacuum (UHV) conditions has been investigated by Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM) and Transmission Electron Microscopy (TEM). We show that the information obtained by these techniques is consistent when comparable, and complementary. In particular, three different morphologies of Pb islands with specific orientation relationship are observed; AFM reveals the faceted shape of the islands; STM permits an accurate determination of the atomic structure of the facets; TEM moir6 patterns reveal that Pb islands are well relaxed.
Publisher
Springer Science and Business Media LLC
Subject
General Engineering