Author:
Waldfried C.,Zeybek O.,Bertrams T.,Barrett S. D.,Dowben P.A.
Abstract
AbstractThe growth of strained thin films of gadolinium has been investigated with low-energy electron diffraction (LEED) and scanning tunneling microscopy (STM) and compared to the film growth of unstrained gadolinium. Strained thin films of gadolinium are distinct from the unstrained films by a substrate induced preferential domain growth direction, which is also reflected in the electronic structure.
Publisher
Springer Science and Business Media LLC
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2 articles.
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