Author:
Rosenthal P. A.,Cosgrove J. E.,Fenner D. B.,Vale L. R.,Ono R. H.,Rudman D. A.
Abstract
AbstractWe have fabricated and tested YBCO step-edge SNS Josephson junctions on silicon substrates. The silicon step edges were patterned photolithographically and reactively ion etched using an SF6 plasma. The structures were fabricated through sequential angled pulsed laser deposition of yttria stabilized zirconia, YBCO, and gold layers, followed by photolithographic patterning and ion milling. The completed devices showed resistively shunted junction (RSJ)-like current voltage characteristics and microwave induced Shapiro steps. Critical currents as large as 84 PA and resistances of order 0.5 Ω were obtained. Measurable critical currents were observed up to 76 K. We report on the fabrication and properties of these junctions.
Publisher
Springer Science and Business Media LLC
Reference15 articles.
1. 10. Gurvitch M. , Tolgygo S. , Shokhor S. , Nadgorny B. , and Likharev K.K. , (unpublished recent result).
2. High quality YBa2Cu3O7 Josephson junctions made by direct electron beam writing
3. 8. Rosenthal P.A. , and Grossman E.N. , “TeraHertz Shapiro Steps in High Temperature SNS Josephson Junctions,” Proceedings of the Fourth International Symposium on Space Terahertz Technology, pp 540–554.
4. Josephson junctions in YBa2Cu3O7−δ by electron beam irradiation
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献