Author:
Böhm M.,Blecher F.,Eckhardt A.,Seibel K.,Schneider B.,Sterzel J.,Benthien S.,Keller H.,Lulé T.,Rieve P.,Sommer M.,Uffel B. Van,Librecht F.,Lind R. C.,Humm L.,Efron U.,Roth E.
Abstract
ABSTRACTImage sensors in TFA (Thin Film on ASIC) technology have been successfully fabricated and tested. This paper provides a survey of TFA research results so far and outlines future perspectives. The properties of different a-Si:H b/w and color thin film detectors are evaluated, including spectral sensitivity, dark current, temperature influence and transient behavior. Furthermore several TFA prototypes and emerging concepts are presented, ranging from a simple one-transistor cell design to a locally autoadaptive sensor.
Publisher
Springer Science and Business Media LLC
Cited by
16 articles.
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