New Method to Determine the a-Si:H Pin Diode Series Resistance by Noise Measurements-Reference-Cited by-同舟云学术

New Method to Determine the a-Si:H Pin Diode Series Resistance by Noise Measurements

Published:1998 Issue: Volume:507 Page:
ISSN:0272-9172
Container-title:MRS Proceedings
language:en
Short-container-title:MRS Proc.

Author:

Blecher F.,Seibel K.,Hillebrand M.,Böhm M.

Abstract

ABSTRACTThe series resistance limits the linearity of photodiodes and decreases the efficiency of solar cells. It is usually determined from IV-measurements for moderate and high forward current density. This method, however, provides only partial information about Rs, since the series resistance depends on the operating point. An alternative method is based on noise measurements. System noise of the measuring system with a low-noise current-voltage converter has been investigated. A new method for extraction of photodiode series resistance from noise measurements is suggested. Noise measurements are carried out for a-Si:H pin diodes. The series resistance of an amorphous pin diode has been extracted for different operating conditions using the new measurement method.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

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