Epitaxial Growth of Strontium Bismuth Tantalate/Niobate on Buffered Magnesium Oxide Substrates

Abstract

AbstractEpitaxial films of strontium bismuth tantalate (SrBi2Ta2O9, SBT) and strontium bismuth niobate (SrBi2Nb2O9, SBN) were grown using solution deposition techniques on magnesium oxide (MgO) substrates buffered with a 100 nm layer of lanthanum manganate (LaMnO3, LMO). Film structure and texture analyses were carried out using x-ray diffraction. Theta-2theta diffraction patterns were consistent with a c-axis aligned structure for both the buffer layer and the solution deposited films. Theta-2 theta scans revealed (001)SBT, SBN //(001) LMO epitaxial relationships between the solution deposited films and the buffer layer. A pole figure about the SBT, SBN (115) reflection indicated a single in-plane epitaxy. Film quality was assessed using ω and φ scans. Nuclear Magnetic Resonance (13C) was used to characterized the methoxy-ethoxide solutions used for the deposition of the SBN and SBT films.