A New Tripod Polisher Method For Preparing Tem Specimens of Particles and Fibers-Reference-Cited by-同舟云学术

A New Tripod Polisher Method For Preparing Tem Specimens of Particles and Fibers

Published:1997 Issue: Volume:480 Page:
ISSN:0272-9172
Container-title:MRS Proceedings
language:en
Short-container-title:MRS Proc.

Author:

Arlderson Ron,Klepeis Stanley J.

Abstract

AbstractA tripod polisher method that extends the use of the tool to the preparation of difficult particulate and fiber specimens, sufficiently thin to permit direct TEM examination with minimal or no ion milling, is detailed. The specimen is surrounded with Si in order to take advantage of the colour changes displayed by thin Si to assess the thickness of the specimen during preparation.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference9 articles.

1. Anderson R. M. , et al., Microscopy of Semiconducting Materials 1989, Proceedings of the Physics Conference held at Oxford University, 10–13 April 1989, ed. by A.G. Cullis and J.L. Hutchison , Institute of Physics Conference Series Number 100, Bristol and New York, 1989.

2. R. Anderson , et al., Microbeam Analysis–1995, Proceedings of the 29th Annual Meeting of the Microbeam Analysis Society, ed. Etz E. , p. 135, 1995.

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