Author:
Bhate N.,Kumar S.,Phillips R.,Clifton R. J.
Abstract
ABSTRACTA modified electrolytic etchant has been successfully used to observe dislocation etch-pits on {100} surfaces of single crystal Ni3AI containing Hf and B additions. Four-point bending tests have been used to obtain the dependence of dislocation velocity on resolved shear stress at room temperature. A comparison with earlier studies reveal that the rate of change of dislocation velocity with resolved shear stress, to a first approximation, is independent of alloying. Atomic level simulations have been performed using the embedded atom method (EAM) to study dislocation core structures and frictional stress in Ni3Al.
Publisher
Springer Science and Business Media LLC