Dielectric Properties of Layer Polymer Films

Abstract

AbstractThe dielectric and thermal properties of three-layer structured films were studied. The two outer layers were about 1 μm and the thickness of the middle layer was varied. We measured the thickness dependence of the dielectric constant of the three-layer structured films. The dielectric results were evaluated with a simple serial three-capacitance model. Local thermal property of these polymer films were also measured using a micro-tip local thermal analysis method. Local glass transition of the film was compared with the one expected from bulk data.