Self-Assembly of Cobalt/Bipyridine Multilayers Modeled After Hofmann Clathrate Compounds

Abstract

ABSTRACTProgress has been made towards the development of inorganic-organic multilayered films modeled after Hofmann clathrate compounds. Cobalt-bipyridine multilayers were grown layer by layer on a silicon substrate. The resulting films were characterized using ellipsometry, grazing angle X-ray diffraction, Auger electron spectroscopy and EPMA (Electron Probe Micro- Analysis). Results indicate that moderately well ordered layers have been synthesized, but cross-linking with M(CN)42(M = Ni, Pd, or Pt) to simulate the model structure does not significantly occur.