Twin and Grain Boundary in InP :A Synchrotron Radiation Study

Author:

Han Yujie,Jiang Jianhua,Wang Zhouguang,Liu Xunlang,Jiao Jinghua,Tian Yulian,Lin Lanying

Abstract

ABSTRACTExperimentally observed X-ray reflectivity curves show bi-crystal(twin) characteristics. The study revealed that there was defect segregation at the twin boundary. Stress was relaxed at the edge of the boundary. Relaxation of the stress resulted in formation of twin and other defects. As a result of formation of such defects, a defect-free and stress-free zone or low defect density and small stress zone is created around the defects. So a twin model was proposed to explain the experimental results. Stress(mainly thermal stress), chemical stoichiometry deviation and impurities nonhomogeneous distributions are the key factors that cause twins in LEC InP crystal growth. Twins on (111) face in LEC InP crystal were studied. Experimental evidence of above mentioned twin model and suggestions on how to get twin-free LEC InP single crystals will be discussed.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

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