Direct Imaging of Ordering in Si-Ge Alloys, Ultrathin Superlattices, and Buried Ge Layers

Author:

Jesson D. E.,Pennycook S. J.,Baribeau J. -M.

Abstract

ABSTRACTWe review recent Z-contrast imaging studies of Si-Ge ultrathin superlattices, alloys, and buried Ge layers. It is found that whenever Si is deposited onto a Ge (2 × 1) surface, Ge is pumped into the growing Si layer, and this is accompanied by interfacial ordering. This is explained by a novel Ge atom pump mechanism which occurs during MBE growth. Codeposition and alloy growth results in long range (111) ordering as a consequence of lateral segregation during nonequilibrium growth.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference18 articles.

1. 16. See Aebi P. , Tylisczak T. , Hitchcock A. P. , Baribeau J. -M. , and Jackman T. E. , these proceedings.

2. 18. Jesson D. E. , Pennycook S. J. , and Baribeau J. -M. (to be published).

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