Electron channeling effect on highly oriented graphites–Size evaluation and oriented mapping of crystals

Abstract

Structural studies on kish graphite (KG) and highly oriented pyrolytic graphite (HOPG) were performed using the techniques of electron channeling pattern (ECP) and electron channeling micrograph (ECM) in the scanning electron microscope. In the KG specimens the ECP for the single crystal was observed for each specimen, while in the HOPG specimens those of polycrystalline graphites with parallel c-axes were observed. The crystal sizes along the a-axis in the HOPG specimens were evaluated by ECM's. The average crystal size was related to a parameter sensitive to their crystallinity, i.e., the ratio of the resistivity at room temperature to that at 4.2 K (residual resistivity ratio). A mapping of the a-axis orientation of HOPG specimens was carried out.