Fim/atom Probe Studies of B—doped and Alloyed Ni3Ai

Abstract

AbstractField—ion microscopy and atom probe microanalysis have been used to determine thestructure and chemistry of grain boundaries in ductile, recrystallized Ni3Al containing 0.23 at % B (500 wt.ppm). The results indicate that the boron concentration fluctuates along the boundary plane and that the boron enriched zone is wider than expected from equilibrium—type adsorption. It was also found that boron lowers the aluminum concentration of some of the boundary regions.