Author:
Wyrsch N.,Miazza C.,Dunand S.,Shah A.,Moraes D.,Anelli G.,Despeisse M.,Jarron P.,Dissertori G.,Viertel G.
Abstract
ABSTRACTVertically integrated particle sensors have been developed using thin-film on ASIC technology. Hydrogenated amorphous silicon n-i-p diodes have been optimized for particle detection. These devices were first deposited on glass substrates to optimize the material properties and the dark current of very thick diodes (with thickness up to 50 m). Corresponding diodes were later directly deposited on two types of CMOS readout chips. These vertically integrated particle sensors were tested in beta particle beam from 63Ni and 90Sr sources. Detection of single low- and high- energy beta particle was achieved.
Publisher
Springer Science and Business Media LLC
Cited by
5 articles.
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