Elemental Mapping by Energy-Filtered Electron Microscopy-Reference-Cited by-同舟云学术

Elemental Mapping by Energy-Filtered Electron Microscopy

Published:1994 Issue: Volume:332 Page:
ISSN:0272-9172
Container-title:MRS Proceedings
language:en
Short-container-title:MRS Proc.

Author:

Krivanek Ondrej L.,Kundmann Michael K.,Bourrat Xavier

Abstract

ABSTRACTEnergy-filtered imaging in a transmission electron microscope provides a fast and quantitative technique for mapping the distribution of elements in solids at nm-level resolution. The technique and its instrumental requirements are reviewed, and illustrated in the context of materials science.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference20 articles.

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2. 19. Ricca N. , Thesis N° 996, Univ. Bordeaux (1994).

3. Design and first applications of a post-column imaging filter

4. Electron energy-loss spectrum-imaging

5. 14. Krivanek O.L. , Bui D.N. , Ray D.A. , Boothroyd C.B. and Humphreys C.J. , Proceedings 13th International Congress on Electron Microscopy, to be published (1994).

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